The Staff Selection Commission (SSC) has announced to conduct the re-examination for recruitment of Sub-Inspectors (SIs) in Delhi Police, CAPFs and Assistant Sub-Inspectors in CISF on June 5, 2016. The commission has cancelled the examination, which was earlier held on March 20, 2016, after it found one of the papers 'to have been compromised'.

“The Staff Selection Commission, in order to maintain the integrity and fairness of the selection process, has suo-motu decided to cancel the examination for the Recruitment of Sub-Inspectors in Delhi Police, CAPFs & Asst. Sub-Inspectors in CISF Examination, 2016 held on 20th March, 2016 because one paper of the afternoon session was found to have been compromised,” the SSC said in a statement.

The paper, which was found to be compromised, belongs to the afternoon shift held on March 20 examination, therefore, only those candidates, who appeared in the afternoon shift, will have to appear for re-examination, the Commission said.


“The re-examination for only those candidates who had appeared in the examination in the forenoon and afternoon shifts on 20th March, 2016 will now be held on 5th June, 2016,” the SSC release said.


Earlier on March 20, the SSC conducted the recruitment examination 2016 for SIs in Delhi Police, CAPFs and ASIs in CISF Examination, in two shifts Morning and Afternoon. Candidates will be shortlisted and recommended for appointment on the basis of their written exam result. No interview will be conducted for the same.


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First published on March 22, 2016

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